Investigating the probability of susceptibility failure within ESD system level consideration.

Autor: Monnereau, N., Caignet, F., Nolhier, N., Tremouilles, D., Bafleur, M.
Zdroj: 2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-6, 6p
Databáze: Complementary Index