Investigating the probability of susceptibility failure within ESD system level consideration.
Autor: | Monnereau, N., Caignet, F., Nolhier, N., Tremouilles, D., Bafleur, M. |
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Zdroj: | 2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-6, 6p |
Databáze: | Complementary Index |
Externí odkaz: |