Characterization of digital cells for statistical test.
| Autor: | Hopsch, F., Lindig, M., Straube, B., Vermeiren, W. |
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| Zdroj: | 2011 IEEE 14th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2011, p255-260, 6p |
| Databáze: | Complementary Index |
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