Design-for-Test method for high-speed ADCs: Behavioral description and optimization.
Autor: | Lechuga, Y., Mozuelos, R., Martinez, M., Bracho, S. |
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Zdroj: | 2011 IEEE 14th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2011, p35-40, 6p |
Databáze: | Complementary Index |
Externí odkaz: |