Design-for-Test method for high-speed ADCs: Behavioral description and optimization.

Autor: Lechuga, Y., Mozuelos, R., Martinez, M., Bracho, S.
Zdroj: 2011 IEEE 14th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2011, p35-40, 6p
Databáze: Complementary Index