Efficient Grouping of Fail Chips for Volume Yield Diagnostics.
| Autor: | Lavanya Jagan, Singh, R.D., Kamakoti, V., Majhi, A.K. |
|---|---|
| Zdroj: | 2009 22nd International Conference on VLSI Design; 2009, p97-102, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Lavanya Jagan, Singh, R.D., Kamakoti, V., Majhi, A.K. |
|---|---|
| Zdroj: | 2009 22nd International Conference on VLSI Design; 2009, p97-102, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|