Prediction of fatigue lifetime based on static strength and crack extension law - Fatigue test of mems materials becomes unnecessary.
| Autor: | Kawai, T., Amaki, S., Gaspar, J., Ruther, P., Paul, O., Kamiya, S. |
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| Zdroj: | 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems; 2008, p431-434, 4p |
| Databáze: | Complementary Index |
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