| Autor: |
Abdullah, Rasha A., Atallah, Faris S., Dahham, Najat A., Razooqia, Mohammed A., Nasir, Eman M., Saeed, Nada M. |
| Předmět: |
|
| Zdroj: |
AIP Conference Proceedings; 9/6/2012, Vol. 1476 Issue 1, p351-355, 5p, 1 Chart, 3 Graphs |
| Abstrakt: |
A comprehensive study of the effect of cadmium sulfide thicknesses on its physical properties is reported. CdS thin films prepared by thermal evaporation technique with substrate temperature of 373 K, the films prepared with 50, 150, 200 and 300nm thicknesses. X-ray diffraction spectra of CdS films were polycrystalline structure of pure hexagonal phase with prepared orientation at (002). The prepared films have been investigated by D.C conductivity and thermoelectric power to study some electrical properties. D.C electrical conductivity display two stages of conductivity through whole heating temperature range. The thermal activation energy for CdS thin films found to decrease with increasing thickness. The conductivity found to increase as thicknesses increased. Thermoelectric power study shows that all prepared films are n-type semiconductor. The hopping and thermal energies decreased as thickness increased. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
