| Autor: |
Dong Ke-Jun, Jiang Shan, He Ming, He Xian-Wen, Ruan Xiang-Dong, Yong-Jing, Guan, Lin De-Yu, Yuan Jian, Wu Shao-Yong |
| Předmět: |
|
| Zdroj: |
Chinese Physics Letters; Jul2012, Vol. 29 Issue 7, p1-3, 3p |
| Abstrakt: |
It has been claimed that the half-life of radioactive nuclides embedded in metals may be significantly affected by the screening of quasi-free electrons provided by the metals, especially at the cryogenic temperature. We determine the &agr;-decay half-life values of 210Po in high purity metallic bismuth at 4.2K and 293 K. The results show that the &agr;-decay half-life of 210Po at T = 4.2K is about (24 ±8)% shorter than that at room temperature. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
