| Autor: |
Hartzell, Allyson L., da Silva, Mark G., Shea, Herbert R. |
| Zdroj: |
Mems Reliability; 2011, p9-42, 34p |
| Abstrakt: |
Reliability continues to be one of the critical drivers for MEMS acceptance and growth. Emerging technologies require marketplace acceptance in order to be designed into high volume and critical applications. Thus, the field of reliability physics must be approached at the most fundamental level when evaluating and predicting micromachined product field performance over the lifetime of the product. The lifetime prediction portion of the reliability program is seen in Fig. 2.1. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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