Analysis of the hysteresis in the I-V characteristics of vertically integrated, multipeaked resonant-tunneling diodes.
Autor: | Kuo, Tai-Haur, Lin, Hung C., Potter, Robert C., Shupe, Dave |
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Zdroj: | Journal of Applied Physics; 9/1/1990, Vol. 68 Issue 5, p2496, 3p, 4 Diagrams, 1 Graph |
Abstrakt: | Presents a study that examined the current-voltage characteristics of vertically integrated, multipeaked resonant-tunneling diodes. Background on resonant-tunneling diode; Methodology; Analysis of the hysteresis in the current-voltage characteristics. |
Databáze: | Complementary Index |
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