| Autor: |
Cooke, D. W., Gray, E. R., Arendt, P. N., Elliott, N. E., Rollett, A. D., Schofield, T. G., Mogro-Campero, A., Turner, L. G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/1/1990, Vol. 68 Issue 5, p2514, 3p, 1 Chart, 4 Graphs |
| Abstrakt: |
Presents a study that measured the microwave surface resistance of yttrium-barium-copper-oxide thin film superconductors on lanthanum aluminum oxide substrates. Methodology; Correlation between the critical current density and the temperature of the thin films; Determination of the metal stoichiometry of the thin films. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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