Microwave properties and strain-induced lattice defects of c-axis-oriented YBa2Cu3O7-δ thin films on silicon.
| Autor: | Jaekel, C., Kyas, G., Roskos, H. G., Kurz, H., Kabius, B., Meertens, D., Prusseit, W., Utz, B. |
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| Zdroj: | Journal of Applied Physics; 9/15/1996, Vol. 80 Issue 6, p3488, 5p |
| Abstrakt: | Deals with a study which examined the microwave properties and crystal structure of thin films on silicon as a function of film thickness. Information on superconducting thin films; Methodology of the study; Results and discussion. |
| Databáze: | Complementary Index |
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