| Autor: |
Bernaerts, D., Tendeloo, G. Van, Amelinckx, S., Hevesi, K., Gensterblum, G., Yu, L. M., Pireaux, J.-J., Grey, F., Bohr, J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/15/1996, Vol. 80 Issue 6, p3310, 9p |
| Abstrakt: |
Deals with a study which examined the transmission electron microscopy of epitaxial carbon films grown on a germanium sulphide surface. High resolution transmission electron microscopy on fullerene films; Methodology of the study; Results and discussion. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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