| Autor: |
Persson, Leif, El Bouanani, Mohamed, Hult, Mikael, Whitlow, Harry J., Andersson, Margaretha, Bubb, Ian F., Johnston, Peter N., Walker, Scott R., Cohen, David D., Dytlewski, Nick, Zaring, Carina, Östling, Mikael |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/15/1996, Vol. 80 Issue 6, p3346, 9p |
| Abstrakt: |
Focuses on a study which examined the interfacial reactions between indium phosphide and thin films of transition metals chromium, nickel, platinum and titanium. Formation of ohmic and rectifying contracts on semiconductor devices; Methodology of the study; Results and discussion. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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