Autor: |
Vidal, R., Baragiola, R. A., Ferrón, J. |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 11/15/1996, Vol. 80 Issue 10, p5653, 6p, 2 Charts, 8 Graphs |
Abstrakt: |
Presents a study which investigated the motion of KeV electrons in a film of solid argon and the depth distribution of ionizations and excitations through the Monte Carlo simulation. Characteristics of the Monte Carlo simulation method; Discussion on the depth distributions of ionizations and excitations; Discussion on the effect of the substrate. |
Databáze: |
Complementary Index |
Externí odkaz: |
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