X-ray diffraction study of GaAs/InAs/GaAs ultrathin single quantum well.

Autor: Bai, Jie, Liu, Wenhan, Wu, Ziqin, Wang, Yutian, Xiu, Lisong, Jiang, Xiaoming
Předmět:
Zdroj: Journal of Applied Physics; 5/15/1996, Vol. 79 Issue 10, p7627, 5p, 1 Diagram, 3 Charts, 6 Graphs
Abstrakt: Presents an X-ray diffraction study of a GaAs/InAs/GaAs ultrathin single quantum well. Simulation method; Results; Discussion.
Databáze: Complementary Index