X-ray diffraction study of GaAs/InAs/GaAs ultrathin single quantum well.
Autor: | Bai, Jie, Liu, Wenhan, Wu, Ziqin, Wang, Yutian, Xiu, Lisong, Jiang, Xiaoming |
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Zdroj: | Journal of Applied Physics; 5/15/1996, Vol. 79 Issue 10, p7627, 5p, 1 Diagram, 3 Charts, 6 Graphs |
Abstrakt: | Presents an X-ray diffraction study of a GaAs/InAs/GaAs ultrathin single quantum well. Simulation method; Results; Discussion. |
Databáze: | Complementary Index |
Externí odkaz: |