| Autor: |
Fresina, Michael T., Hartmann, Quesnell J., Ahmari, David A., Gardner, Nathan F., Stillman, Gregory E. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/15/1995, Vol. 77 Issue 10, p5437, 3p, 2 Charts, 2 Graphs |
| Abstrakt: |
Presents a study that investigated the common-emitter offset voltages in several double-heterojunction bipolar transistors. Correlation between the physical mechanisms behind the variations in the offset voltage and the base current of the samples; Methodology; Comparison of the common-emitter voltage-current characteristics of the samples. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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