| Autor: |
Floro, J. A., Kellerman, B. K., Chason, E., Picraux, S. T., Brice, D. K., Horn, K. M. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/15/1995, Vol. 77 Issue 6, p2351, 7p, 7 Graphs |
| Abstrakt: |
Presents information on a study which described the surface point defects that were produced during low-energy ion bombardment of the germanium (001)-(2X1) using in situ reflection high-energy electron diffraction. Information on the reflection high-energy electron diffraction; Experimental details; Results and discussion; Conclusions. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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