| Autor: |
Lachenmann, S. G., Filatrella, G., Ustinov, A. V., Doderer, T., Kirchmann, N., Quenter, D., Huebener, R. P., Niemeyer, J., Pöpel, R. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/15/1995, Vol. 77 Issue 6, p2598, 9p |
| Abstrakt: |
Investigates the higher order zero field steps of long inline and overlap Josephson junctions by means of low temperature scanning electron microscopy. Dynamics of the Josephson tunnel junction; Expression for the exact analytical solution of the unperturbed system corresponding to the presence of a fluxon. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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