| Autor: |
Nur, O., Willander, M., Hultman, L., Radamson, H. H., Hansson, G. V., Sardela, M. R., Greene, J. E. |
| Předmět: |
|
| Zdroj: |
Journal of Applied Physics; 12/15/1995, Vol. 78 Issue 12, p7063, 7p, 4 Black and White Photographs, 2 Diagrams, 3 Graphs |
| Abstrakt: |
Presents information on a study which investigated the microstructure and microchemistry of CoSi[sub2]/Si[sub1-x]Ge/Si(001) heterostructures using a combination of high-resolution cross-sectional transmission electron microscopy, high-resolution x-ray diffraction and secondary-ion mass spectroscopy. Experimental procedure; Results and discussion; Conclusions. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
