Infrared reflectance of thick p-type porous SiC layers.
| Autor: | MacMillan, M. F., Devaty, R. P., Choyke, W. J., Goldstein, D. R., Spanier, J. E., Kurtz, A. D. |
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| Zdroj: | Journal of Applied Physics; 8/15/1996, Vol. 80 Issue 4, p2412, 8p, 1 Black and White Photograph, 10 Graphs |
| Abstrakt: | Discusses a study which presented room-temperature reflectance measurements of thick, monocrystalline, p-type porous 6H silicon carbide layers. Theoretical background; Methods used; Results. |
| Databáze: | Complementary Index |
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