Autor: |
Ji, Mingrong, Zhu, Jingsheng, Ma, Maosheng, Wu, Jianxin, Liu, Xianming, Jin, Bangkun, Yang, Beifang, He, Pingsheng, Ruan, Yaozhong |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 8/15/1996, Vol. 80 Issue 4, p2471, 4p, 2 Graphs |
Abstrakt: |
Focuses on a study which explored an x-ray photoelectron spectroscopic analysis of the interaction between polyimide film made by the Langmuir-Blodgett method and silicon. Background on silicon carbide; Description of the experimental setup; Results and discussion. |
Databáze: |
Complementary Index |
Externí odkaz: |
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