| Autor: |
Vigild, M. E., Findeisen, E., Feidenhans’l, R., Barholm-Hansen, C., Bentzon, M. D., Bindslev Hansen, J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 4/15/1996, Vol. 79 Issue 8, p4050, 7p, 3 Diagrams, 3 Charts, 4 Graphs |
| Abstrakt: |
Provides information on a study which used combined neutron and x-ray reflectometry to determine the mass density and hydrogen content for thin diamondlike hydrocarbon films on polished silicon substrates. Methods; Results and discussion; Conclusion. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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