Surface roughness in Cu(100)/[Co/Cu]n systems grown by ion-beam sputtering.

Autor:	Minvielle, Timothy J., White, Robert L., Wilson, Robert J.
Předmět:	SURFACE roughness COBALT COPPER surfaces SCANNING tunneling microscopy
Zdroj:	Journal of Applied Physics; 4/15/1996, Vol. 79 Issue 8, p5116, 3p
Abstrakt:	Deals with a study which investigated the development of surface roughness in cobalt and copper systems through the use of in situ scanning tunneling microscopy. Methods; Results; Discussion.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu