Scattering of evanescent light by a finite-size probe in near-field scanning optical microscopy.

Autor:	Fukuzawa, Kenji, Kuwano, Hiroki
Předmět:	LIGHT scattering NEAR-field microscopy SCANNING probe microscopy OPTICS
Zdroj:	Journal of Applied Physics; 11/1/1996, Vol. 80 Issue 9, p4799, 5p, 1 Diagram, 2 Graphs
Abstrakt:	Focuses on a study which calculated the scattering of the evanescent light by a finite-size SiO[sub2] probe in near field scanning optical microscopy. Electromagnetic-field calculation; Results and discussion; Conclusion.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu