| Autor: |
Hong, Hawoong, Aburano, R. D., Chung, Ki-Sup, Lin, D.-S., Hirschorn, E. S., Chiang, T.-C., Chen, Haydn |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/1/1996, Vol. 79 Issue 9, p6858, 7p, 3 Black and White Photographs, 4 Graphs |
| Abstrakt: |
Presents information on a study that determined surface roughness by x-ray diffraction for germanium films on germanium grown by molecular beam epitaxy at room temperature. Experimental details; Results and discussion; Summary. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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