| Autor: |
Herzinger, C. M., Snyder, P. G., Celii, F. G., Kao, Y.-C., Chow, D., Johs, B., Woollam, J. A. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/1/1996, Vol. 79 Issue 5, p2663, 12p, 7 Charts, 10 Graphs |
| Abstrakt: |
Provides information on a study that investigated the optical constants for thin layers of strained InAs, AlAs and AlSb layers by spectroscopic ellipsometry and multi-sample analysis. Experimental procedures; Results and discussion on the study; Conclusions. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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