| Autor: |
Ahmad, Ahmad A., Ianno, N. J., Snyder, P. G., Welipitiya, D., Byun, D., Dowben, P. A. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 6/1/1996, Vol. 79 Issue 11, p8643, 5p, 1 Chart, 6 Graphs |
| Abstrakt: |
Provides information on a study that determined the optical constants of plasma-enhanced chemical-vapor deposition boron carbide thin films by spectroscopic ellipsometry and spectrophotometry. Experimental procedure; Results and discussion on the study. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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