| Autor: |
Liu, M., Suddendorf, M. B., Somekh, M. G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 7/1/1994, Vol. 76 Issue 1, p207, 9p, 1 Diagram, 1 Chart, 10 Graphs |
| Abstrakt: |
Presents a study which analyzed the problem of the response of interferometer based non-destructive probe systems to photodisplacement in layered media. Analytical solution for the photodisplacement in a layered medium; Discussion of photodisplacement and associated phenomena contributing to the overall response; Measurement of the thickness of thin films. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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