| Autor: |
Ustinov, A. V., Lemke, S., Doderer, T., Huebener, R. P., Kuzmin, L. S., Pashkin, Yu. A. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 7/1/1994, Vol. 76 Issue 1, p376, 9p, 2 Black and White Photographs, 1 Diagram, 1 Chart, 1 Graph |
| Abstrakt: |
Presents a study which discussed the application of low temperature scanning electron microscopy for the investigation of single-electron tunneling circuits. Experimental setup; Scheme of measurements; Electronic potential mapping. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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