Relative coherency strain and phase transformation history in epitaxial ferroelectric thin films.
| Autor: | Foster, C. M., Pompe, W., Daykin, A. C., Speck, J. S. |
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| Zdroj: | Journal of Applied Physics; 2/1/1996, Vol. 79 Issue 3, p1405, 11p, 1 Black and White Photograph, 2 Diagrams, 2 Charts, 4 Graphs |
| Abstrakt: | Presents information on a study which examined relative coherency strain and phase transformation history in epitaxial ferroelectric thin films. Experimental procedure; Results; Discussion. |
| Databáze: | Complementary Index |
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