| Autor: |
Bentini, G. G., Nipoti, R., Berti, M., Drigo, A. V., Cohen, C. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/1/1985, Vol. 58 Issue 3, p1234, 6p |
| Abstrakt: |
Analyzes the solid-phase reaction of a thin film and a substrate induced by a transient annealing in the solid phase. Application of Rutherford backscattering analysis technique; Problem of computation of temperature profile induced on a sample by the scanning of a line-shaped energy beam; Result of localized x-ray diffraction analyses. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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