Atomic resolution imaging of a nonconductor by atomic force microscopy.
| Autor: | Albrecht, T. R., Quate, C. F. |
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| Zdroj: | Journal of Applied Physics; 10/1/1987, Vol. 62 Issue 7, p2599, 4p, 1 Black and White Photograph, 3 Diagrams |
| Abstrakt: | Presents a study that examined the capability of the atomic force microscope in imaging the surface of an electrically insulating solid with atomic resolution. Background on atomic force microscopy; Analysis of the lever-sample interaction; Results and implications. |
| Databáze: | Complementary Index |
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