In situ observation of fractal growth during a-Si crystallization in a Cu3Si matrix.

Autor: Russell, S. W., Li, Jian, Mayer, J. W.
Předmět:
Zdroj: Journal of Applied Physics; 11/1/1991, Vol. 70 Issue 9, p5153, 3p, 1 Black and White Photograph, 4 Graphs
Abstrakt: Presents a study on the in situ observation of both the silicidation reaction, forming Cu[sub3]Si and the subsequent crystallization of the remaining amorphous silicon (Si) in the silicide matrix. Discussion on the crystallization of amorphous silicon; Method used in determining the average thickness and composition of the samples; Record of the growth process of dendrite Si.
Databáze: Complementary Index