| Autor: |
Buczkowski, A., Radzimski, Z. J., Rozgonyi, G. A., Shimura, F. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/1/1991, Vol. 69 Issue 9, p6495, 5p, 1 Chart, 7 Graphs |
| Abstrakt: |
Focuses on a study that presented an algorithm for separating the bulk and surface components of recombination lifetime, tailored for contactless measurement techniques with laser excitation. Lasers needed to be applied in order to analyze the carrier decays and subtract the surface recombination term; Cause of a separation of carrier decay resulting from the different contribution of surface and bulk components; Area where recombination lifetime measurements are useful. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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