Deposition of device quality, low H content amorphous silicon.

Autor: Mahan, A. H., Carapella, J., Nelson, B. P., Crandall, R. S., Balberg, I.
Předmět:
Zdroj: Journal of Applied Physics; 5/1/1991, Vol. 69 Issue 9, p6728, 3p, 4 Graphs
Abstrakt: Deals with a study that discussed the deposition of device-quality hydrogenated amorphous silicon observed in device-quality glow discharge films by thermal decomposition of silane. Capacity of bonded hydrogen concentrations; Reason for the need of a sizeable fraction of hydrogen; Capability of an alternative deposition method.
Databáze: Complementary Index