| Autor: |
Edelman, F., Cytermann, C., Brener, R., Eizenberg, M., Weil, R., Beyer, W. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 6/15/1993, Vol. 73 Issue 12, p8309, 4p, 2 Graphs |
| Abstrakt: |
Presents a comparative study of interfacial reactions between palladium and amorphous germanium by X-ray diffraction and Auger electron spectroscopy after sample annealing. Observations on the reaction between palladium and amorphous germanium; Effect of the deposition temperature of the germanium; Structural differences between germanium and palladium. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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