dc electroluminescence in copper-free Zns:Mn thin films. I. Local destructive breakdown and its dependence on preparation and test conditions.

Autor: Blackmore, J. M., Cattell, A. F., Dexter, K. F., Kirton, J., Lloyd, P.
Předmět:
Zdroj: Journal of Applied Physics; 1/15/1987, Vol. 61 Issue 2, p714, 8p, 1 Black and White Photograph, 2 Diagrams, 3 Graphs
Abstrakt: Presents a study that investigated the local destructive breakdown of direct current electroluminescence in copper-free zinc sulphide: manganese thin films. Analysis of the dielectric breakdown; Examination of the non-destructive dielectric conduction; Factors affecting localized destructive breakdown rates in simple direct current thin film electroluminescent devices.
Databáze: Complementary Index