dc electroluminescence in copper-free ZnS:Mn thin films. II. A dielectric breakdown theory of instability.

Autor: Cattell, A. F., Inkson, J. C., Kirton, J.
Předmět:
Zdroj: Journal of Applied Physics; 1/15/1987, Vol. 61 Issue 2, p722, 12p, 3 Diagrams, 6 Graphs
Abstrakt: Presents a study that investigated the application of a dielectric breakdown theory to direct coupled thin-film electroluminescence (DCTFEL) in zinc sulphide: manganese. Background on the dielectric breakdown theory; Effects of current-controlled negative resistance on DCTFEL devices; Qualitative comparison between predictions of dielectric breakdown theory and experimental observations of direct coupled electroluminescence devices.
Databáze: Complementary Index