| Autor: |
Macrander, A. T., Schwartz, G. P., Gualtieri, G. J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 12/15/1988, Vol. 64 Issue 12, p6733, 13p |
| Abstrakt: |
Presents information on a study which analyzed double-crystal rocking curves of samples grown on oriented gallium antimonide substrates by molecular-beam epitaxy by fitting computer simulations to data for the symmetric and reflections and for assymetric reflections. Methodology of the study; Results and discussion; Conclusions. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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