Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.
| Autor: | Feng, Z. C., Sudharsanan, R., Perkowitz, S., Erbil, A., Pollard, K. T., Rohatgi, A. |
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| Zdroj: | Journal of Applied Physics; 12/15/1988, Vol. 64 Issue 12, p6861, 3p |
| Abstrakt: | Presents information on a study which examined the quality of cadmium compound thin films grown by metalorganic chemical vapor deposition using Raman scattering. Description the thin films; Methodology of the study; Results and discussion. |
| Databáze: | Complementary Index |
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