Crystal quality investigation of InGaAs/InP and InGaAlAs/InP single heterostructures grown by molecular-beam epitaxy.
Autor: | Ferrari, C., Franzosi, P., Gastaldi, L., Taiariol, F. |
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Zdroj: | Journal of Applied Physics; 4/15/1988, Vol. 63 Issue 8, p2628, 5p, 6 Graphs |
Abstrakt: | Deals with a study which assessed the crystal quality of InGaAs/InP single heterostructures grown by molecular-beam epitaxy using x-ray double-crystal diffractometry. Experimental details; Results and discussion; Conclusion. |
Databáze: | Complementary Index |
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