| Autor: |
Mankos, Marian, Scheinfein, M. R., Cowley, J. M. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 6/1/1994, Vol. 75 Issue 11, p7418, 7p |
| Abstrakt: |
Presents a study which developed a method for the absolute measurement of magnetization at nanometer spatial resolution in magnetic thin films. Comparison of the micromagnetic structure extracted from identical areas of thin cobalt films; Results of electron holography obtained in a scanning transmission electron microscope (STEM); Description of the differential mode of STEM holography. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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