Effect of rf power on remote-plasma deposited SiO2 films.

Autor: Hattangady, S. V., Alley, R. G., Fountain, G. G., Markunas, R. J., Lucovsky, G., Temple, D.
Předmět:
Zdroj: Journal of Applied Physics; 6/1/1993, Vol. 73 Issue 11, p7635, 8p, 1 Chart, 6 Graphs
Abstrakt: Studies the effect of radio frequency power on remote-plasma deposited SiO[sub2] films. Details on the experiment; Results of the study; Discussion of findings.
Databáze: Complementary Index