Interface roughness of short-period AlAs/GaAs superlattices studied by spectroscopic ellipsometry.
| Autor: | Nguyen, N. V., Pellegrino, J. G., Amirtharaj, P. M., Seiler, D. G., Qadri, S. B. |
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| Zdroj: | Journal of Applied Physics; 6/1/1993, Vol. 73 Issue 11, p7739, 8p, 6 Graphs |
| Abstrakt: | Investigates the effects of interface roughness on the optical properties of ultrathin short-period gallium arsenide/aluminum arsenide superlattices grown by molecular-beam epitaxy. Details on the experiment; Data analyses; Results of the study. |
| Databáze: | Complementary Index |
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