Autor: |
Sakashita, Yukio, Segawa, Hideo, Tominaga, Kouji, Okada, Masaru |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 6/1/1993, Vol. 73 Issue 11, p7857, 7p, 2 Black and White Photographs, 1 Diagram, 1 Chart, 7 Graphs |
Abstrakt: |
Presents a study which described the relationship between film thickness and the electrical properties of metalorganic chemical vapor deposition-deposited Pb(Zr[subx]Ti[sub1-x])O[sub3] (PZT) thin films. Applications of PZT; Microstructure of PZT; Experimental details; Results and discussion; Conclusions. |
Databáze: |
Complementary Index |
Externí odkaz: |
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