Chaos and thermal noise in the rf-biased Josephson junction.

Autor: Kautz, R. L.
Předmět:
Zdroj: Journal of Applied Physics; 7/1/1985, Vol. 58 Issue 1, p424, 17p, 17 Graphs
Abstrakt: Presents a study that examined the effect of thermal noise on the chaotic behavior in a Josephson junction. Analysis of the chaotic behavior in a Josephson junction at zero temperature; Evaluation of metastable chaotic states of the Josephson junction; Characteristics of the noise-affected current-voltage characteristics.
Databáze: Complementary Index