Autor: |
Alexander, S., Hellemans, L., Marti, O., Schneir, J., Elings, V., Hansma, P. K., Longmire, Matt, Gurley, John |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 1/1/1989, Vol. 65 Issue 1, p164, 4p, 5 Black and White Photographs, 1 Diagram |
Abstrakt: |
Presents the first atomic-resolution image of a surface obtained with an optical implementation of the atomic-force microscope (AFM). Production of the resolution images of aluminum; Production of corroded stainless steel; Relative merits of an optical implementation of the AFM. |
Databáze: |
Complementary Index |
Externí odkaz: |
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