An atomic-resolution atomic-force microscope implemented using an optical lever.

Autor: Alexander, S., Hellemans, L., Marti, O., Schneir, J., Elings, V., Hansma, P. K., Longmire, Matt, Gurley, John
Předmět:
Zdroj: Journal of Applied Physics; 1/1/1989, Vol. 65 Issue 1, p164, 4p, 5 Black and White Photographs, 1 Diagram
Abstrakt: Presents the first atomic-resolution image of a surface obtained with an optical implementation of the atomic-force microscope (AFM). Production of the resolution images of aluminum; Production of corroded stainless steel; Relative merits of an optical implementation of the AFM.
Databáze: Complementary Index