Analysis of GaAs Schottky/tunnel metal–insulator–semiconductor diode characteristics based on an interfacial layer model.

Autor: Ikoma, Hideaki, Ishida, Toshiki, Sato, Kenji, Ishikawa, Toshifumi, Maeda, Keiji
Předmět:
Zdroj: Journal of Applied Physics; 2/1/1993, Vol. 73 Issue 3, p1272, 7p, 2 Diagrams, 6 Graphs
Abstrakt: Presents information on a study which investigated the current-voltage characteristics of gallium arsenic Schottky and tunnel metal-insulator-semiconductor diodes. Experimental procedures; Discussion; Conclusion.
Databáze: Complementary Index