Autor: |
Landsberg, P. T., Shaban, E. H. |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 6/1/1987, Vol. 61 Issue 11, p5055, 7p |
Abstrakt: |
Focuses on a study which examined the nonexponential capacitance transient decay arising from the composition of capture with the thermal emission rate in the deep-level spectroscopy method (DLTS). Assessment of the solution of kinetic equation; Evaluation of the thermal emission rate; Comparison of exponential and nonexponential transients. |
Databáze: |
Complementary Index |
Externí odkaz: |
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