Thermal stability and electrical conduction behavior of coevaporated WSi2±x thin films.
Autor: | Nava, F., Weiss, B. Z., Ahn, K. Y., Smith, D. A., Tu, K. N. |
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Zdroj: | Journal of Applied Physics; 7/1/1988, Vol. 64 Issue 1, p354, 11p, 27 Graphs |
Abstrakt: | Observes thermal stability and electrical conduction behavior of coevaporated thin films. Details on the experiment; Discussion of findings; Conclusion. |
Databáze: | Complementary Index |
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