Thermal stability and electrical conduction behavior of coevaporated WSi2±x thin films.

Autor: Nava, F., Weiss, B. Z., Ahn, K. Y., Smith, D. A., Tu, K. N.
Předmět:
Zdroj: Journal of Applied Physics; 7/1/1988, Vol. 64 Issue 1, p354, 11p, 27 Graphs
Abstrakt: Observes thermal stability and electrical conduction behavior of coevaporated thin films. Details on the experiment; Discussion of findings; Conclusion.
Databáze: Complementary Index